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Webinar focuses on fewer field flash failures

Nov 27, 2006 — by LinuxDevices Staff — from the LinuxDevices Archive

On Thursday, Dec. 7, Datalight will present another in its series of webinars covering issues related to flash memory. Customer support and services manager Robert Krantz will discuss how to reduce warranty returns by identifying common failure scenarios and incorporating those scenarios into test suites, according to the company.

Datalight claims that warranty returns represent one of the single biggest drains on profits for a manufacturer — both as a “hard cost” for repair or replacement, and as a “soft cost” in reduced customer confidence, which may impact future purchases. While eliminating 100 percent of defects is not realistic, understanding key vulnerabilities and optimizing test suites around them can significantly reduce returns, according to the company.

The webinar, entitled “Reducing Field Failures: Is Your Data Integrity Testing Sufficient,” will be offered at 7:00 am, 10:30 am, and 4:00 pm PST on Dec. 7. The program will last 45 minutes and will include a question and answer session. Attendance is limited to the first 100 registrants who sign up here.


 
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